Thursday, December 15, 2016

Angstrom Advanced PHE-104 Infrared Spectroscopic Ellipsometer


Angstrom Advanced PHE-104 Infrared Spectroscopic Ellipsometer

Parameters
Wavelength: 4000-400cm-1(2.5-25um)
Beam size: 1X34mm
Automated incident angle35° to 90°0.01°/Step

Functions/Features
Film’s thickness, N & K measurement;
Resistivity measurements and doping profiles;
Identification of chemical bonds and buried layers investigation ;
Transmittance and reflectance;
 
 
For More Information:
GOOGLE+:
https://plus.google.com/u/0/112027144483956231979
BLOG:
http://angstrom-advanced.blogspot.com/
FACEBOOK:
https://www.facebook.com/angstromadvanced8/
WORDPRESS:
https://angstromadvancedinc.wordpress.com/
TWITTER:
https://twitter.com/AngstromAdvance
LINKEDIN:
https://www.linkedin.com/company/angstrom-advanced?trk=nav_account_sub_nav_company_admin
SLIDESHARE:
http://www.slideshare.net/AngstromAdvanced
PINTEREST:
https://www.pinterest.com/pin/309481805615112886/

No comments:

Post a Comment