Angstrom Advanced OS-AA Opening Multifunction Scanning Probe Microscope

OS-AA Opening Multifunction Scanning Probe Microscope

Introductions

OS-AA SPM system is known for its multi-functionality and full openness. OS-AA system is not just a platform for unconventional experiments but also for further developments.

Features

Milti-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase Imaging with Full digital control 16bit ADC/DAC High speed communication based on TCP/IP protocol for double-CPU-double-OS and large data-exchange Input/output signal channel preserved for further system extension Standard external open interface for second developments I-V Curve and Force-Curve Nano-Processing Nano-manipulating with Super-Multimedia technology Designed for Windows Vista/XP/NT/2000/9X Hardcode and Dynamic Code both applied to offline software Brightness and contrast auto refreshed Multi-Analysis: Granularity and Roughness

Specifications

Resolution: AFM: 0.26nm lateral, 0.1nm vertical;STM: 0.13nm lateral, 0.01nm vertical Current Sensitivity: ≤10pA Force Sensitivity: ≤ 1nN Positioning Accuracy: ≤ 0.5nm Output channels preserved: 6ch (1ch ± 10V, 16-bit DAC) Input channels preserved: 16ch (100k/16-bit ADC with Low-pass filter and amplifier) DI/DO channels preserved: 8ch DI, 8ch DO

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