Features
High Performance:
- Atomic-scale of resolution
- Large sample size
- DSP(Digital Signal Processing) for great performance
- Real time operating system embedded
- Fast Ethernet connection with computer
Multi-Function:
- Atomic Force Microscope (AFM)
- Lateral Force Microscope (LFM)
- Force Analysis: I-V Curve, I-Z Curve, Force Curve
- Online real-time 3D image for better observation
- Multi-channel signals for more sample details
- Trace-Retrace scan, Back-Forward scan
- Multi-Analysis: Granularity and Roughness
- Data load-out for further analysis
Easy Operation:
- Fast automatically tip-engaging
- Easy change of the tip holder, for simple switching between STM and AFM
- Full digital control, auto system status recognition
- Software-based sample movement
- Nano-Movie function: Continuous data collection, storage and replay
- Modularized design for convenient maintenance and future upgrades
Specifications
For More Information:
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TWITTER:https://twitter.com/AngstromAdvance
LINKEDIN:
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SLIDESHARE:http://www.slideshare.net/AngstromAdvanced
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For More Information:
GOOGLE+:https://plus.google.com/u/0/112027144483956231979
BLOG:http://angstrom-advanced.blogspot.com/
FACEBOOK:https://www.facebook.com/angstromadvanced8/
WORDPRESS:https://angstromadvancedinc.wordpress.com/
TWITTER:https://twitter.com/AngstromAdvance
LINKEDIN:
https://www.linkedin.com/company/angstrom-advanced?trk=nav_account_sub_nav_company_admin
SLIDESHARE:http://www.slideshare.net/AngstromAdvanced
PINTEREST:https://www.pinterest.com/pin/309481805615112886/
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