Friday, March 31, 2017

Angstrom Advanced OS-AA Opening Multifunction Scanning Probe Microscope

Introductions
OS-AA SPM system is known for its multi-functionality and full openness. OS-AA system is not just a platform for unconventional experiments but also for further developments.
Features
  • Milti-function: STM, AFM, LFM, MFM, EFM, Contacting Mode, Tapping, Phase
  • Imaging with Full digital control 16bit ADC/DAC
  • High speed communication based on TCP/IP protocol for double-CPU-double-OS and large data-exchange
  • Input/output signal channel preserved for further system extension
  • Standard external open interface for second developments
  • I-V Curve and Force-Curve
  • Nano-Processing
  • Nano-manipulating with Super-Multimedia technology
  • Designed for Windows Vista/XP/NT/2000/9X
  • Hardcode and Dynamic Code both applied to offline software
  • Brightness and contrast auto refreshed Multi-Analysis: Granularity and Roughness
Specifications
  • Resolution: AFM: 0.26nm lateral, 0.1nm vertical;STM: 0.13nm lateral, 0.01nm vertical
  • Current Sensitivity: ≤10pA
  • Force Sensitivity: ≤ 1nN
  • Positioning Accuracy: ≤5nm
  • Output channels preserved: 6ch (1ch ± 10V, 16-bit DAC)
  • Input channels preserved: 16ch (100k/16-bit ADC with Low-pass filter and amplifier)
  • DI/DO channels preserved: 8ch DI, 8ch DO
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Wednesday, March 29, 2017

Angstrom Advanced AA8000 Multi-function SEM System

Introductions
Angstrom AA8000-SEM is a true multi-purpose, multi-user instrument. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. This instrument features a perfect balance between stable configuration and an excellent resolution. Angstrom-SEM clearly shows Angstrom’s state-of-art technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytical capability. Angstrom-SEM pursues compact SEM design which is great for office environment. Angstrom-SEM provides high scan speed and pixel resolution and high performance control driver with new PCI board. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus.
Features
High Performance
  • Field proven image quality
  • Upgraded scan speed and pixel resolution.
  • Wide variety of optional instrument
  • Resolution : 3.0 nm
  • Magnification : ~1,000,000X
  • Display : Photo 4096X 4096
  • Search : 640X480 30fps
  • Options : BSE / WDS / EDS / EBSD / Etc.
Gun Coumn
  • Gun design for stable current supply
  • Dual field objective lens for spherical
  • Aberration reduction
  • Movable aperture for beam centering
  • Upgraded design of magnetic lens (CL/OL)
Chamber & Stage
  • 5 axis eucentric stage
  • Option: Stage motorization
  • EDS,WDS,CCD, Manipulator etc
  • 50X60X57mm
Detector
  • ET-bar type SE detector
  • SE & BSE double image mode
  • Option: BSE detector
GUI
  • Window based GUI
  • PC controlled operation
  • Image thumbnail & storage
  • Parameter Display
Vacuum System
  • Automatic & Manual control
  • Automatic Safety System
  • P+D.P/ R.P+TMP
Image Analyzer
  • Data transfer to Excel
  • Particle counter for blob analysis
  • Multi-focusing & Tiling
  • 3D data view etc
Specifications

 

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Monday, March 27, 2017

Angstrom Advanced AA7000 SEM Scanning Electron Microscope


 
Introductions
Angstrom-SEM is a true multi-purpose, multi-user Scanning Electron Microscope. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment. On this instrument, there is a perfect balance between stable configuration and an excellent resolution.
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Friday, March 24, 2017

AA6000 MINI DESKTOP SCANNING ELECTRON MICROSCOPE

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Introductions
Angstrom-mini-SEM is a true desktop multi-purpose, multi-user Scanning Electron Microscope. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment, and perfect balance between stable configuration and excellent resolution.
Specifications
Resolution7nm(Option: 5nm@20KV)
Acceleration Voltage0.6KeV ~ 20KeV (Option: 30KV)
Visual Inpection SourceElectron induced Display (Tungsten Hair Pin Type)
Probe CurrentnA ~pA for SEM, Max. ~ 3uA
Bean ControlBeam Shift : ±125um, Beam Rotation: 360°
SE DetectorHigh Sensitivity SE detector
Image Signal process5 Steps: Area(768X576),Search (960X720, 1280*960) Photo Mode (1920X1440, 3840X2880)
Work-Piece PositioningTilted Holder 0°~60° (Max 90°)
5 Axis Stage Movement StrokeX/Y/Z/=-40/40/30mm Tilt: 0~60° Rotation=360° Option: Stage Motorization (3 Axis-X/Y/R)
Vacuum systemFull Automation (or Manual Mode) Rotary Pump & Turbo Pump Convection Gauge(Pirani + Penning Gauge)
Anti-VibrationAir-Cylinder type anti-vibrator included in frame. Air or Any gas supply such as N2 line required at Lab site
Control RackPC Environmental Operation Operating system : Windows Serial communication: control data interface
Display System22” LCD monitor
Port3 Port (For EDX, WDX, Etc.). Port Sufficient for all detector & Up-gradation
GUI& ToolsBSE Mode Converter Switch(BSE, EDX, ETC.) Pixel averaging scan/ Photo Scan/ etc. Measurement (Angle, Area, Horizontal. Vertical, Width, Cross, Box) Simple Measuring function by using Horizontal Line, Vertical Line, Diagonal Lines, Boxes, Angle, Area, etc. Annotation (Symbol Such Circle, Boxes, Line, Arrowed, Line), Image Shift & Image Rotation(Raster Rotation) Image Compression / Compression Type : BMP, JPEG, Data Including Magnification, Working Distance, KV & Mark Bar. Thumbnail Image Display
Image ProcessorLength/Min.dia/Max dia/Circularity/Eccentricity/Excel Data/Graph Data export to Excel file with original Image Free Line Measurement, Grain analysis Various User Define Filters Image Tiling AOI(Area Of Interest) Particle Counter (Blob Analysis)
Automatic ControlAuto Brightness/ Contrast Multi Focus & Dynamic Focus Auto Focus/ Auto stigmator/ etc. Auto Emission Beam Current Raster Rotation (Mouse Adjustment) Cathode Using Time ( Life Time)) Mouse Control(Dragging or Scroll Methodology)
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Wednesday, March 22, 2017

Angstrom Advanced AA5000 Multi-function SPM Systems


Introductions
AA5000 Scanning Probe Microscope is Angstrom most innovated model. AA5000 features a full coverage of SPM techniques-STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing... AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, AA5000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA5000 SPM system.
Features
  • Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM;
  • Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode;
  • SPM can be in liquid;
  • Real-time temperature and humidity detecting;
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve;
  • Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode;
  • Fast automatically tip-engaging
  • Simply change of the tip holder to switch between STM and AFM;
  • Full digital control, auto system status recognition;
  • Adjustable lightening inside
  • With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved;
  • Controller and Computer connected through a 10M/100M Fast Ethernet;
  • Large sample size: up to diameter 45mm, 30mm thick;
  • Online Control Software and offline Image Processing Software for Windows;
  • Trace-Retrace scan, Back-Forward scan;
  • Online real-time 3D image;
  • Automatically Brightness and Contrast refresh;
  • Data can be loaded out for further analysis;
  • Nano-Movie function: Continuous data collection, storage and replay;
  • Multi-Analysis: Granularity and Roughness;
  • Tip Estimation and Image Re-construction;
  • Modularized design for convenience of maintenance and future upgrade;
  • Second display monitor and optical microscope system attachable;
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Monday, March 20, 2017

Angstrom Advanced AA3000 Scanning Probe Microscope

Introduction
AA3000 Scanning Probe Microscope is our most popular model. This unit is tailored towards research and industry applications, where the user is required to perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system.
Features
High Performance
  • Atomic-scale of resolution
  • Large sample size
  • DSP (Digital Signal Processor)- for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer
Multi-Function
  • Atomic Force Microscope (AFM)
  • Scanning Tunneling Microscope (STM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis
Easy Operation
  • Fast automatically tip-engaging
  • Simple change of the tip holder to switch between STM and AFM
  • Full digital control, auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades
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Friday, March 17, 2017

Angstrom Advanced AA2000 Atomic Force Microscope


Features
High Performance:
  • Atomic-scale of resolution
  • Large sample size
  • DSP(Digital Signal Processing) for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer
Multi-Function:
  • Atomic Force Microscope (AFM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis
Easy Operation:
  • Fast automatically tip-engaging
  • Easy change of the tip holder, for simple switching between STM and AFM
  • Full digital control, auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades
Specifications

 
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Monday, March 13, 2017

Angstrom Advanced AXFQ series portable directional X-ray flaw detector (with glass x-ray tube)

Introduction
AXFH series portable circumferential glass tube X-ray flaw detector is designed to facilitate nondestructive testing (NDT) of welding seam of pipes and tubes with small diameters. With the optional propelling wheels or pipe crawler installed, the X-ray generator can be easily positioned in any pipe. The NDT of circumferential welding can be accomplished in one exposure.
Specifications

 
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Friday, March 10, 2017

Angstrom Advanced AXFG series portable X-ray flaw detector (with rippled ceramic x-ray tube)

Introduction
AXFG series detector is equipped with a rippled ceramic x-ray tube. Some of the advantages of using rippled ceramic x-ray tube are: higher voltage and power, smaller size, higher stability and longer service life. With its long service life, good shockproof ability, compact size and lightweight design, AXFG X-ray flaw detector is the best choice for most applications.
Models and Specifications

 
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Wednesday, March 8, 2017

ADX-8000 Mini θ - θ Powder X-ray Diffraction Instrument

Introduction
ADX-8000 mini θ-θ Powder X-ray Diffraction Instrument is a multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX8000 has been uniquely designed for the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project. Components are top of the line and provide for a powerful system. The ADX8000 has capability for powders, liquid, thin film, nanomaterials and many other different materials. The ADX8000 can be used for many different applications - Academic, Pharmaceuticals, Chemical & Petrochemical, Materials Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc..
Features
  • Perfect incorporation of the hardware and software, allows ADX-8000 to perform different types of analysis for researchers from various fields;
  • High precision of the diffraction angle measurement allows ADX-8000 to obtain the more accurate data;
  • Higher stability of the X-ray generator control system provides excellent measurement accuracy;
  • Simple and effective design makes ADX-8000 convenient for operation and user friendly.
Software
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, lattice parameter, volumes and atomic position, phase analysis, crystallographic strain, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern et al.
Qualitative Analysis
The data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
Quantitative Analysis
After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion). Phase identification, structure & microstructure analysis, thin film analysis, stress investigation, texture analysis are all available. PDF-2, PDF-4 Series Data base, ICDD, Search & Match, Crystallographic Search & Match
Plot and Export
The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
Parts and Specifications

 
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