Monday, March 20, 2017

Angstrom Advanced AA3000 Scanning Probe Microscope

Introduction
AA3000 Scanning Probe Microscope is our most popular model. This unit is tailored towards research and industry applications, where the user is required to perform rapid and simple analysis. The detector is built directly into the base, eliminating the chance of damaging it through handling. AA3000 is capable of performing contact mode, tapping mode, lateral force microscopy and scanning tunneling microscopy. The standard unit is equipped to view sample areas up to 10 micron by 10 micron. The system can be customized to measure larger areas. With a Digital Signal Processor (DSP) TMS320C642 inside the systems, AA3000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA3000 SPM system.
Features
High Performance
  • Atomic-scale of resolution
  • Large sample size
  • DSP (Digital Signal Processor)- for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer
Multi-Function
  • Atomic Force Microscope (AFM)
  • Scanning Tunneling Microscope (STM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis
Easy Operation
  • Fast automatically tip-engaging
  • Simple change of the tip holder to switch between STM and AFM
  • Full digital control, auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades
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Friday, March 17, 2017

Angstrom Advanced AA2000 Atomic Force Microscope


Features
High Performance:
  • Atomic-scale of resolution
  • Large sample size
  • DSP(Digital Signal Processing) for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer
Multi-Function:
  • Atomic Force Microscope (AFM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis
Easy Operation:
  • Fast automatically tip-engaging
  • Easy change of the tip holder, for simple switching between STM and AFM
  • Full digital control, auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades
Specifications

 
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Monday, March 13, 2017

Angstrom Advanced AXFQ series portable directional X-ray flaw detector (with glass x-ray tube)

Introduction
AXFH series portable circumferential glass tube X-ray flaw detector is designed to facilitate nondestructive testing (NDT) of welding seam of pipes and tubes with small diameters. With the optional propelling wheels or pipe crawler installed, the X-ray generator can be easily positioned in any pipe. The NDT of circumferential welding can be accomplished in one exposure.
Specifications

 
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Friday, March 10, 2017

Angstrom Advanced AXFG series portable X-ray flaw detector (with rippled ceramic x-ray tube)

Introduction
AXFG series detector is equipped with a rippled ceramic x-ray tube. Some of the advantages of using rippled ceramic x-ray tube are: higher voltage and power, smaller size, higher stability and longer service life. With its long service life, good shockproof ability, compact size and lightweight design, AXFG X-ray flaw detector is the best choice for most applications.
Models and Specifications

 
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Wednesday, March 8, 2017

ADX-8000 Mini θ - θ Powder X-ray Diffraction Instrument

Introduction
ADX-8000 mini θ-θ Powder X-ray Diffraction Instrument is a multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX8000 has been uniquely designed for the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project. Components are top of the line and provide for a powerful system. The ADX8000 has capability for powders, liquid, thin film, nanomaterials and many other different materials. The ADX8000 can be used for many different applications - Academic, Pharmaceuticals, Chemical & Petrochemical, Materials Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc..
Features
  • Perfect incorporation of the hardware and software, allows ADX-8000 to perform different types of analysis for researchers from various fields;
  • High precision of the diffraction angle measurement allows ADX-8000 to obtain the more accurate data;
  • Higher stability of the X-ray generator control system provides excellent measurement accuracy;
  • Simple and effective design makes ADX-8000 convenient for operation and user friendly.
Software
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, lattice parameter, volumes and atomic position, phase analysis, crystallographic strain, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern et al.
Qualitative Analysis
The data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
Quantitative Analysis
After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion). Phase identification, structure & microstructure analysis, thin film analysis, stress investigation, texture analysis are all available. PDF-2, PDF-4 Series Data base, ICDD, Search & Match, Crystallographic Search & Match
Plot and Export
The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
Parts and Specifications

 
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Wednesday, March 1, 2017

Angstrom Advanced ADX-2500 X-ray Diffraction Instrument


 2
Angstrom Advanced ADX-2500 X-ray Diffraction Instrument
Introduction
ADX-2500 X-ray Diffraction Instrument is designed for application in the microstructure measurement, testing and in-depth research investigations. With different accessories and the corresponding control and calculating software,ADX-2500 is a diffraction system according to the practical requirements in many fields.
ADX-2500 X-ray Diffraction Instrument provides the structure analysis of single crystal, polycrystalline and amorphous sample.ADX-2500 is capable of the following: phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis(ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis and others.
Features
§  Perfect incorporation of the hardware and software, allows ADX-2500 to perform different types of analysis for researchers from various fields;
§  High precision of the diffraction angle measurement allows ADX-2500 to obtain the more accurate data;
§  Higher stability of the X-ray generator control system provides excellent measurement accuracy;
§  Simple and effective design makes ADX-2500 convenient for operation and user friendly.
 3
Software
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1, α2, background remove, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern.
§  Profile fitting and overlapped peeks separation
With the help of Pseudo-Voigt or Pearson-VII function, the overlapped peeks could be separated to determine the parameters of the peaks and calculate the crystallinity, crystallite size and strain.
§  Qualitative Analysis
The data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
§  Quantitative Analysis
After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion).
§  Plot and Export
The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
Parts and Specifications
X-ray Generator
Control mode
1kV/step, 1mA/step controlled by PC
Rated output power
4 kW
Tube voltage
10-60 kV
Tube current
5-80 mA
X-ray tube
Cu, Fe, Co, Cr, Mo et al (2.4 kW)
Focus dimension: 1×10 mm2 or 0.4×10 mm2
Stability
≤ 0.01%
Goniometer
Goniometer
thetaθ/thetaθ
Diffraction circle semi-diameter
225mm
Scan range of 2θ
-6°-160°
Continuous scanning rate
0.06°-50°/min
Setting speed of angle
1500°/min
Scan mode
θ-2θ linkage, θ,2θ one way: continuous or step scanning
One way repeatability of 2θ
≤ 0.001°
Minimal stepping angle
0.001°
Precision of 2θ
≤ 0.02°
Record Unit
Counter
PC or SC
Maximal CPS
5×106 CPS
Proportion counter energy spectrum resolution
≤ 25%(PC),
≤ 55%(SC)
Detectable high voltage
1500-2100 V continuous tune
High voltage of the counter
differential or integral, automatic PHA, dead time emendation
System detector stability
≤ 0.01%
Integrated performance
Dispersion dosage
≤ 1μSv/h
Integrated stability of the system
≤ 0.5%
Dimension
1000 × 800 × 1600 mm

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Monday, February 27, 2017

Angstrom Advanced Model 22 UV/VIS Spectrophotometer

Introduction
The model 22 is a simple single beam spectrophotometer. The wavelength is set manually from the dial on the front panel. Direct readout of Transmission or Absorption shows on the LED display. Measured values can be transferred to a PC via the RS232 link for further analysis. Low price and simple design make this instrument ideal for education or routine analysis.
Features
Simple & clear keyboard operation provides auto 0%T & 100%T adjustment, error-free T/A transformation, factor setting and direct concentration readout functions.
Software package provides basic functionality for manipulating spectroscopic data, calculating concentrations and transferring the information to spreadsheets
Specifications

 
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Thursday, February 23, 2017

Magnetic Resonance Imgaing MRI-300


Introduction:
Magnetic Resonance Imaging MRI-300 is specially designed for living animal’s observation. it provides high contrast images and accurate messages in vivo intuitively, equipped with permanent magnet. As a powerful and non-destructive MRI instrument, this system is widely used in life sciences to study tissue structure in vivo and their contrast message dispense with special maintenance cost....

Application:
Contrast agent MRI of subcutaneous tumor
Multilayer MRI of 150g rat's head MRI
 
Specification:
Magnet: permanent,0.5±0.05T:
Magnetic field uniformity: ≤ 20ppm(60mm×60mm×60mm);
Magnetic field stability: ≤300Hz/Hour;
Magnet temperature control: dual system of nonlinear precise temperature control, temperature tunable from 25℃ to 35℃ ; temperature control accuracy ±0.05℃ ;
RF field: pulse frequency: 2~30MHz; frequency control accuracy: 0.1Hz;
RF power amplifier: peak-to-peak value > 300W;
Maximum bandwidth is 2000KHz;
MRI gradient: X, Y, Z-peak intensity > 2.5Gauss/cm;
Probe caliber: 60mm;
Effective detection area: Ø60mm×H60mm;
Image quality: image linearity (x, y, z three direction) > 90%, spatial resolution better than 1mm;
Maximum echo peak number is 18,000; minimum echo time is 360us;
Based on PCI bus industrial control computer platform, dual-core CPU, 4G DDR memory, 500G hard disk, DVD_R/W CD-ROM.
Power supply: 220V, 50Hz
Work temperature: 22~28°C
Environment humidity: 30~70%
Dimensions (L, W, H): 1540mm×800mm×1200mm.
Total Weight:0.8 tons(Magnet 0.7 tons, control cabinet 0.1 tons)
 
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